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AFM analysis of the polymer micro-structures used for novel multi-analyte protein micro-assay

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conference contribution
posted on 2024-07-11, 12:19 authored by Duy K. Pham, Jonathan P. Wright, Elena Ivanova, Dan V. Nicolau
We recently described a technique to fabricate shallow (< 50 nm) microstructures on PMMA surface for use in multianalyte protein micro-assay based on the ablation of a top thin gold layer using pulsed nitrogen laser (337 nm). In the present study, AFM has been used to investigate the surface characteristics and to provide physical insights into the formation of these complex microstructures. It has been shown that lateral diffusion of the heat generated during the gold ablation extended to ca. 3 µm on either side of the laser focal spot (ca. 5µmm wide), effectively ablated the gold layer and created shallow regions of ca. 20 nm. The heat also created a depression (ca. 5 µm wide) in the polymer region at the laser spot, and a hump, that increased in height with laser dose, at the center of the depression. It is suggested that volume shrinkage caused by stress relaxation and material redistribution, and volume expansion caused by fragmentation of the polymer are responsible mechanisms. Chemical changes also occurred resulting in the middle zone of the microstructure, which corresponds to the central hump, being hydrophobic, whereas the outer zone was hydrophilic. It is suggested that degraded hydrophilic products may be present in the outer zone, whereas the middle zone may contain smaller hydrophobic fragments due to more advanced fragmentation. The variation in the morphology and surface chemistry in the shallow microstructures effectively 'combinatorialize' the surface properties of the microstructures, thus facilitating the patterning of different proteins.

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ISSN

0277-786X

Journal title

Proceedings of SPIE - The International Society for Optical Engineering

Conference name

SPIE - The International Society for Optical Engineering

Volume

4966

Pagination

8 pp

Publisher

SPIE

Copyright statement

Copyright © 2003 SPIE Society of Photo-Optical Instrumentation Engineers. The published version is reproduced in accordance with the copyright policy of the publisher.

Language

eng

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