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An Efficient Defect Estimation Method for Software Defect Curves

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conference contribution
posted on 2024-07-11, 13:39 authored by Chenggang Bai, Kai Yuan Cai, Tsong ChenTsong Chen
Software defect curves describe the behavior of the estimate of the number of remaining software defects as software testing proceeds. They are of two possible patterns: single-trapezoidal-like curves or multiple-trapezoidal-like curves. In this paper we present some necessary and/or sufficient conditions for software defect curves of the Goel-Okumoto NHPP model. These conditions can be used to predict the effect of the detection and removal of a software defect on the variations of the estimates of the number of remaining defects. A field software reliability dataset is used to justify the trapezoidal shape of software defect curves and our theoretical analyses. The results presented in this paper may provide useful feedback information for assessing software testing progress and have potentials in the emerging area of software cybernetics that explores the interplay between software and control.

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ISSN

0730-3157

Journal title

Proceedings - IEEE Computer Society's International Computer Software and Applications Conference

Conference name

IEEE Computer Society's International Computer Software and Applications Conference

Pagination

5 pp

Publisher

IEEE

Copyright statement

Copyright © 2003 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Language

eng

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