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BEAT: Boolean Expression fAult-based Test case generator

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conference contribution
posted on 2024-07-26, 14:43 authored by Tsong ChenTsong Chen, D. D. Grant, Man LauMan Lau, Sebastian NgSebastian Ng, V. R. Vasa
This paper presents a system which generates test cases from Boolean expressions. The system is based on the integration of several fault-based test case selection strategies developed by us. Our system generates test cases that are guaranteed to detect all single operator fault and all single operand faults when the Boolean expression is in irredundant disjunctive normal form. Apart from being an automated test case generation tool developed for software testing practitioners, this system can also be used as a training or self-learning tool for students as well as software testing practitioners.

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ISBN

780377249

Journal title

Proceedings, ITRE 2003 - International Conference on Information Technology: Research and Education

Conference name

ITRE 2003 - International Conference on Information Technology: Research and Education

Pagination

4 pp

Publisher

IEEE

Copyright statement

Copyright © 2003 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Language

eng

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