Direct visualization of focusing effect of step corrugated nanoplasmonic slits
conference contribution
posted on 2024-07-09, 19:00 authored by Baohua Jia, Haofei Shi, Jiafang Li, Yongqi Fu, Chunlei Du, Min GuA scanning near-field optical microscope (SNOM) is employed to directly visualize the focusing and focal depth modulation effect of a step corrugated nanoplasmonic slit fabricated with focused ion beam milling.
History
Available versions
PDF (Published version)Publisher DOI
ISBN
9781424438303ISSN
2162-2701Conference name
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical DigestVolume
48Issue
1Publisher
IEEECopyright statement
Copyright © 2009 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.Language
engUsage metrics
Categories
No categories selectedKeywords
Licence
Exports
RefWorks
BibTeX
Ref. manager
Endnote
DataCite
NLM
DC