posted on 2024-07-11, 14:41authored byR. W. Van Der Heijden, L. Fu, H. H. Tan, C. Jagadish, Lap Dao, M. Gal
Impurity free vacancy disordering (IFVD) is induced in both GaAs/AIGaAs and InGaAs/AlGaAs QWs using undoped, Ga-doped and P-doped spin-on glass encapsulant layers. IFVD has been studied for different annealing and pre-baking temperatures, using low temperature photoluminescence (PL). The P-doped and undoped silica layers behave similarly in promoting IFVD, inducing large energy shifts. The Ga-doped silica layer suppresses IFVD, which is explained by the reduction of Ga outdiffusion from the QW structure into the oxide layer.