Focused evanescent field under radially polarized beam illumination
conference contribution
posted on 2024-07-09, 23:34 authored by Baohua Jia, Xiaosong Gan, Min GuIn order to eliminate the focus deformation and at the same time localize the field near the interface, a tightly focused evanescent field combining with a radially polarized illumination, generated by interference method with a single LCD, is proposed in this paper. A scanning near-field optical microscope (SNOM) has been employed to observe the focal spot near the interface by means of directly scanning over the focal field.
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780392175ISSN
1092-8081Journal title
Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOSConference name
Lasers and Electro-Optics Society Annual Meeting-LEOSVolume
2005Pagination
1 pPublisher
Institute of Electrical and Electronics EngineersCopyright statement
Copyright © 2005 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.Language
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