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Isolating Suspiciousness from Spectrum-Based Fault Localization Techniques

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conference contribution
posted on 2024-07-11, 07:39 authored by XiaoYuan Xie, Tsong ChenTsong Chen, Baowen Xu
Spectrum-based fault localization (SBFL) is one of the most promising fault localization approaches, which normally uses the failed and passed program spectrum to evaluate the risks for all program entities. However, it does not explicitly distinguish the different degree in definiteness between the information associated with the failed spectrum and the passed spectrum, which may result in an unreliable location of faults. Thus in this paper, we propose a refinement method to improve the accuracy of the predication by SBFL, through eliminating the indefinite information. Our method categorizes all statements into two groups according to their different suspiciousness, and then uses different evaluation schemes for these two groups. In this way, we can reduce the use of the unreliable information in the ranking list, and finally provide a more precise result. Experimental study shows that for some SBFL techniques, our method can significantly improve their performance in some situations, and in other cases, it can still remain the techniques' original performance.

Funding

Metamorphic Testing: An In-Depth Study to Enhance the Failure-Detection Capability of Software Testing Without an Oracle

Australian Research Council

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PDF (Published version)

ISBN

9781424480784

ISSN

1550-6002

Conference name

2010 10th International Conference on Quality Software

Pagination

7 pp

Publisher

IEEE

Copyright statement

Copyright © 2010 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Language

eng

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