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Laser patterning of TiN films from metal sacrificial layers for surface micromachining applications

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conference contribution
posted on 2024-07-11, 18:28 authored by Andrew J. Dowling, Erol C. Harvey, Derry Doyle
This paper presents the results of our investigations on the laser micromachining of titanium nitride (TiN) films. Machining performance was evaluated in terms of layer selectivity and patterning quality. TiN was arc-deposited onto (100) silicon substrate with chromium (Cr) and copper (Cu) sacrificial layers. Films were also deposited onto bare silicon substrates under the same conditions. These samples were laser micromachined using a KrF excimer laser at 248 nm. The effect of fluence and number of shots on the machined features has been investigated in detail. The patterned features were examined under optical, confocal and scanning electron microscopes. The characteristics observed were analysed and compared in all three sets of samples. The results showed selective removal of TiN films from Cr and Cu sacrificial layers under different conditions. The machining of TiN from (100) silicon showed relatively poor definition of patterned features. The analysis of these results indicated that laser machining of TiN from Cr and Cu layers is best explained using the explosion mechanism of removal.

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Conference name

Profiles in Industrial Research: Knowledge and Innovation 2002, St Kilda, Victoria, Australia, 15-19 July 2002

Issue

1

Pagination

5 pp

Publisher

Swinburne University of Technology

Copyright statement

Copyright © 2002 Published by Swinburne University of Technology.

Notes

Part of this work has been performed under the ANSIE grant No. 01/170. The authors acknowledge the help received from Dr Ken Short and Dr Peter Evans from ANSTO. The authors would also like to thank Surface Technology Coatings for providing access to the Filtered Arc Deposition unit for carrying out this work; Mr Martin Lloyd-Diviny of Olympus Australia Pty Ltd for helping and also providing training to use the Laser scanning confocal microscope OLS1100. Finally, thanks to Mr Hans Brinkies for SEM imaging and EDS analysis work.

Language

eng

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