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On detection conditions of double faults related to terms in boolean expressions

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conference contribution
posted on 2024-07-11, 12:29 authored by Man LauMan Lau, Y. Liu, Y. T. Yu
Detection conditions of specific classes of faults have recently been studied by many researchers. Under the assumption that at most one of these faults occurs in the software under test, these fault detection conditions were mainly used in two ways. First, they were used to develop test case selection strategies for detecting corresponding classes of faults. Second, they were used to study fault class hierarchies, where a test case that detects a particular class of faults can also detect some other classes of faults. In this paper, we study detection conditions of double faults. Besides developing new test case selection strategies and studying new fault class hierarchies, our analysis provides further insights to the effect of fault coupling. Moreover, these fault detection conditions can be used to compare effectiveness of existing test case selection strategies (which were originally developed for the detection of single occurrence of certain classes of faults) in detecting double faults that may be present in the software. Abstract not available.

Funding

Fault-Based Test Case Generation for Software

Australian Research Council

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PDF (Published version)

ISBN

769526551

ISSN

0730-3157

Journal title

Proceedings - International Computer Software and Applications Conference

Conference name

International Computer Software and Applications Conference

Volume

1

Pagination

7 pp

Publisher

IEEE

Copyright statement

Copyright © 2006 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in oTher works must be obtained from The IEEE.

Language

eng

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