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On orbit performance of the MIPS instrument

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conference contribution
posted on 2024-08-06, 11:14 authored by G. H. Rieke, E. T. Young, J. Cadien, C. W. Engelbracht, K. D. Gordon, D. M. Kelly, F. J. Low, K. A. Misselt, J. E. Morrison, J. Muzerolle, G. Rivlis, J. A. Stansberry, J. W. Beeman, E. E. Haller, D. T. Frayer, W. B. Latter, A. Noriega-Crespo, D. L. Padgett, D. C. Hines, Doug Bean, W. Burmester, G. B. Heim, Tom Glenn, R. Ordonez, J. P. Schwenker, S. Siewert, D. W. Strecker, S. Tennant, J. Troeltzsch, B. Unruh, R. M. Warden, P. A.R. Ade, A. Alonso-Herrero, M. Blaylock, H. Dole, E. Egami, J. L. Hinz, E. Le Floc'h, C. Papovich, P. G. Peréz-González, M. J. Rieke, P. S. Smith, K. Y.L. Su, L. Bennett, D. Henderson, N. Lu, F. Masci, M. Pesenson, L. Rebull, J. Rho, J. Keene, S. Stolovy, S. Wachter, W. Wheaton, P. L. Richards, Harry Garner, M. Hegge, M. L. Henderson, K. MacFeely, D. Michika, C. D. Miller, M. Neitenbach, J. Winghart, R. Woodruff, E. Arens, C. Beichman, S. Gaalema, T. N. Gautier, C. Lada, Jeremy MouldJeremy Mould, G. Neugebauer, K. R. Stapelfeldt
The Multiband Imaging Photometer for Spitzer (MIPS) provides long wavelength capability for the mission, in imaging bands at 24, 70, and 160 microns and measurements of spectral energy distributions between 52 and 100 microns at a spectral resolution of about 7%. By using true detector arrays in each band, it provides both critical sampling of the Spitzer point spread function and relatively large imaging fields of view, allowing for substantial advances in sensitivity, angular resolution, and efficiency of areal coverage compared with previous space far-infrared capabilities. The Si:As BIB 24 micron array has excellent photometric properties, and measurements with rms relative errors of 1% or better can be obtained. The two longer wavelength arrays use Ge:Ga detectors with poor photometric stability. However, the use of 1.) a scan mirror to modulate the signals rapidly on these arrays, 2.) a system of on-board stimulators used for a relative calibration approximately every two minutes, and 3.) specialized reduction software result in good photometry with these arrays also, with rms relative errors of less than 10%.

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ISSN

0277-786X

Journal title

Proceedings of SPIE - The International Society for Optical Engineering

Conference name

SPIE - The International Society for Optical Engineering

Volume

5487

Issue

PART 1

Pagination

11 pp

Publisher

SPIE

Copyright statement

Copyright © 2004 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Proceedings of SPIE (Vol. 5487), and is available from: http://dx.doi.org/10.1117/12.551965. The published version is reproduced in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content are prohibited.

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eng

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