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Selective localised modifications of silicon crystal by ultrafast laser induced micro-explosion

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conference contribution
posted on 2024-08-06, 09:30 authored by Ludovic Rapp, Bianca Haberl, Jodie E. Bradby, Eugene G. Gamaly, Jim S. Williams, Saulius JuodkazisSaulius Juodkazis, Andrei V. Rode, Xianfan Xu, Guido Hennig, Yoshiki Nakata, Stephan W. Roth
Femtosecond (fs) laser pulses focused and confined inside the bulk of a material can deposit a volume energy density up to several MJ/cm3 in a sub-micron volume. This creates highly non-equilibrium, hot, dense and short-lived plasmas with conditions favorable for arrangement of atoms into unusual material phases. Singlecrystal silicon was exposed to strong shock waves induced by laser micro-explosion in confined geometry. The conditions of confinement were realized by focusing 170-fs pulses, with the energy up to 2.5 μJ, on a Si surface buried under a 10-μm thick SiO2-layer formed by oxidation of a Si-wafer. The generated intensity was 1015 W/cm2, well above the threshold for optical breakdown and plasma formation. The shock wave modified areas of the Si crystal were sectioned using a focused-ion beam and characterized with scanning electron microscopy. A void surrounded by a shock-wave-modified Si was observed at the Si/SiO2 boundary. The results demonstrate that confined micro-explosion opens up new perspectives for studies of high-pressure materials at the laboratory table-top expanding the laser-induced micro-explosion capabilities into the domain of non-transparent materials.

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PDF (Published version)

ISBN

9780819493767

ISSN

0277-786X

Journal title

Proceedings of SPIE - The International Society for Optical Engineering

Conference name

Conference on Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM)

Location

San Francisco, California

Start date

2013-02-02

End date

2013-02-07

Volume

8607

Pagination

5 pp

Publisher

SPIE

Copyright statement

Copyright © 2013 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Proceedings of SPIE (Vol. 8607), and is available from: http://dx.doi.org/10.1117/12.2007550. The published version is reproduced in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content are prohibited.

Language

eng

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