Swinburne
Browse
- No file added yet -

Surface plasmon enhanced light-trapping in polycrystalline silicon thin-film solar

Download (555.48 kB)
conference contribution
posted on 2024-07-13, 06:45 authored by S. Varlamov, Z. Ouyang, X. Zhao, D. S. Jung
The paper reports a development and implementation of light trapping based on light scattering from plasmonic metal nanoparticles. The nanoparticles were formed on the surface of planar polycrystalline Si thin-film solar cells by annealing of a precursor Ag film. The light absorption by the cells and resulting photocurrent enhancement is maximised by optimising the design of the nanoparticle light-trapping scheme, which includes the nanoparticle size and location, the local dielectric environment, and an application of a supplementary back surface reflector. A large photocurrent enhancement is achieved due to high scattering and coupling efficiencies of the incident light from Ag nanoparticles into the thin-film cells. For the optimum design comprising a 'Si-film/nanoparticles/magnesium fluoride/diffuse white paint' structure short-circuit current enhancement of 44% is demonstrated for the cell fabricated by e-beam evaporation on 3 mm thick planar glass superstrate. The enhancement is further increased up to 50% when the developed light-trapping scheme is applied to the cell fabricated by PECVD on 1 mm thick planar glass superstrate.

History

Available versions

PDF (Published version)

ISBN

9781424498826

Journal title

Photonics Global Conference (PGC 2010),Singapore, 14-16 December 2010

Conference name

Photonics Global Conference PGC 2010,Singapore, 14-16 December 2010

Publisher

IEEE

Copyright statement

Copyright © 2010 IEEE. The published version is reproduced in accordance with the copyright policy of the publisher. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Language

eng

Usage metrics

    Publications

    Categories

    No categories selected

    Keywords

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC