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Synthesis of super-dense phase of aluminum under extreme pressure and temperature conditions created by femtosecond laser pulses in sapphire

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posted on 2024-07-26, 14:07 authored by Vygantas Mizeikis, Arturas Vailionis, Eugene G. Gamaly, Wenge Yang, Andrei Rode, Saulius JuodkazisSaulius Juodkazis, Winston V. Schoenfeld, Raymond C. Rumpf, Georg von Freymann
We describe synthesis of a new super-dense phase of aluminum under extreme pressure and temperature conditions created by laser-induced microexplosions in sapphire. Micro explosions in sub-micrometer sized regions of sapphire were induced by tightly-focused femtosecond laser pulses with a temporal length of ~ 100 fs and an energy of ~ 100 nJ. Fast, explosive expansion of photogenerated high-density plasma created strong heating and pressure transients with peak temperature and pressure of ~ 105 K and 10 TPa, respectively. Partial decomposition of sapphire in the shock-compressed sapphire led to formation of nanocrystalline bcc-Al phase, which is different from ambient fcc-Al phase, and was permanently preserved by fast quenching. The existence of super-dense bcc-Al phase was confirmed using X-ray diffraction technique. This is the first observation of bcc-Al phase, which so far has been only predicted theoretically, and a demonstration that laser-induced micro explosions technique enables simple, safe and cost-efficient access to extreme pressures and temperatures without the tediousness typical to traditional techniques that use diamond anvil cells, gas guns, explosives, or megajoule-class lasers.

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ISBN

9780819488923

ISSN

0277-786X

Journal title

Proceedings of SPIE - The International Society for Optical Engineering Vol 8249: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V

Conference name

Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V

Location

San Francisco, CA

Start date

2012-01-24

End date

2012-02-25

Volume

8249

Issue

5

Pagination

82490a-82490a-12-

Publisher

SPIE

Copyright statement

Copyright © 2012 Society of Photo-Optical Instrumentation Engineers. This paper was originally published in Proceedings of SPIE (Vol. 8249), and is available from: http://dx.doi.org/10.1117/12.906946. The published version is reproduced in accordance with the copyright policy of the publisher. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content are prohibited.

Language

eng

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