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Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity

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posted on 2024-07-09, 22:43 authored by Ivan U. Vakarelski, Scott A. Edwards, Raymond R. Dagastine, Derek Chan, Geoffrey W. Stevens, Franz Grieser
A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.

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ISSN

0034-6748

Journal title

Review of Scientific Instruments

Volume

78

Issue

11

Article number

article no. 116102

Pagination

1 p

Publisher

American Institute of Physics

Copyright statement

Copyright © 2007 American Institute of Physics. The published version is reproduced with the permission of the publisher.

Language

eng

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